Noise in CMOS image sensors (CIS) has always been the key factor to compete with its counterpart technology of charged coupled devices (CCDs) in industrial and scientific applications. In the wake of that, a lot of research has been carried out broadly targeting the category of temporal and spatial noise. Noise suppression strategiesfor both these categorieshave experienced significant change in its design, especially after the year 2000. While the earliermethods of temporal noise removal including local oxidation, transistor sizing, accommodation of pinned photodiodes etc. majorly targeted the restructuring of sensor’s pixel; modern strategies focus on off-chip noise cancellation schemes with variety of sampling and reset methods.This paper addresses the study on resent noise source and its suppression strategy