Authors :
Dr. V. Lakshmi Priya, Dr. N. Prithivi kumaran.
Volume/Issue :
Volume 3 - 2018, Issue 12 - December
Google Scholar :
https://goo.gl/DF9R4u
Scribd :
https://goo.gl/Z61YfN
Thomson Reuters ResearcherID :
https://goo.gl/KTXLC3
Abstract :
The grain size value of Ni doped ZnO thin films increases with the Ni concentration and it deteriorates the ZnO crystalline quality. The bandgap values of Ni doped ZnO thin films were found to decreases with increase in Ni concentration. The low reflectance and high value of index possessed by ZnO and Ni doped ZnO films are suitable for antireflection coatings. The Optical bandgap values obtained by single oscillator model for ZnO film exactly matches with the Tauc’s plot values. The resistivity values of Ni doped ZnO films decreses with increase in Ni doping concentration.
Keywords :
ZnO Nano Structures; Doping; XRD; Refractive Index; Resistivity.
The grain size value of Ni doped ZnO thin films increases with the Ni concentration and it deteriorates the ZnO crystalline quality. The bandgap values of Ni doped ZnO thin films were found to decreases with increase in Ni concentration. The low reflectance and high value of index possessed by ZnO and Ni doped ZnO films are suitable for antireflection coatings. The Optical bandgap values obtained by single oscillator model for ZnO film exactly matches with the Tauc’s plot values. The resistivity values of Ni doped ZnO films decreses with increase in Ni doping concentration.
Keywords :
ZnO Nano Structures; Doping; XRD; Refractive Index; Resistivity.
