Popular Case Studies of Various VLSI Test Scan Architectures


Authors : Madhura.R, Ravi Shankar J, Dr. Shanthi Prasad .M.J.

Volume/Issue : Volume 3 - 2018, Issue 3 - March

Google Scholar : https://goo.gl/DF9R4u

Scribd : https://goo.gl/Yxw6qF

Thomson Reuters ResearcherID : https://goo.gl/3bkzwv

In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.

Keywords : Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.

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Paper Submission Last Date
31 - August - 2022

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