Structural and Morphological properties are the two fundamental tasks involved in the physical characterization newly synthesized nanostructured material. In this paper, Statistical image analysis of SEM images is employed for the characterization of Mg, Ce co-doped CdO nanosystems. Statistical parameters: Mean, Energy, Homogeneity and Edge density of the SEM images are computed using MATLAB software. The formation of crystalline grains and grain boundaries of SEM images are used as key features for the characterization of CdOnanosystems with increasing concentration of dopants Mg and Ce. Molecular structure of the material was elucidated using X- ray diffraction studies.Results obtained from this methodology are compared with the X-rd studies and are in good agreement with each other.

Keywords : Nano Materials, Scanning Electron Microscopy, X-Ray Diffraction, Statistical Image Analysis, Morphological Properties, MATLAB.